PV Module reliability testing horizons need to correlate with financial modeling assumptions.

CFV Labs has developed a comprehensive 40 year bankability testing program based on IEC 63209 with technology specific customization.

Includes tests for material durability, cell degradation, mechanical durability and performance testing. 

CFV Labs has tested both older and newer backsheets to the new IEC TS 63209 backsheet testing protocol.

We find that both older and newer backsheets can fail this test.

Module construction is important, not just backsheet material.

Ongoing testing at CFV is pushing the expected horizon of backsheet tests out to 40 years. 

Comprehensive bankability testing program based on IEC 63209 with technology specific customization.

Includes tests for material durability, cell degradation, mechanical durability and performance testing.

Third party BOM verification and build witness. 

Report sharing with investors and IEs.

Both LID and LeTID can be problems with newer technology modules, especially modules made from PERC cells, and some bifacial modules.

LID and LeTID operate via different mechaninsms and on different time scales and and may actually overlap, making disentangling the effects problematic.

CFV has a protocol designed to isolate and quantify each effect to the extent possible.